Scientific information service STN from Chemical Abstracts Service and Fiz Karlsruhe has upgraded STN AnaVist for 2008 with a strong focus on analysing patent information.
The Derwent World Patents Index (DWPI) has now been incorporated into the analysis features, allowing information professionals to analyse patent data from the CAplus, USPATFULl and PCTFULL databases. Christine McCue of CAS said the upgrade was targeted at "strengthening" patent related information available from STN.
A set of new clustering fields have been added including, All Claims,
Exemplary/First Claim, International Patent Classification (IPC) Codes and
Technology Indicators. These and new visual tools allow users create bar charts
depicting information from the DWPI Class, DWPI Manual Codes, Labels, Patent
Country Codes and Kind Codes.
A pair of document management tools have also been integrated to allow a
research department to tag and classify information or groups of information, as
well as highlight that parts of documents useful to their organisation.